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X - ray diffraction patterns of the products obtained by saturating with H2S of a solution of Cu ( I ) and In ( III ) in ( a ) ... additional peaks in the pattern ( a ) are due to S ( ASTM 8-247 ) , in ( b ) , due to CuS ( ASTM 6-464 ) .
X - ray diffraction patterns of the products obtained by saturating with H2S of a solution of Cu ( I ) and In ( III ) in ( a ) ... additional peaks in the pattern ( a ) are due to S ( ASTM 8-247 ) , in ( b ) , due to CuS ( ASTM 6-464 ) .
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X - ray diffraction patterns of the condensed products taken from ( a ) the filter - trap , ( b ) the furnace nozzle , ( c ) the furnace : 400 8 9 12 13 14 15 v x 102 , Fig . 3. The IR spectra of the condensed products : ( a ) ...
X - ray diffraction patterns of the condensed products taken from ( a ) the filter - trap , ( b ) the furnace nozzle , ( c ) the furnace : 400 8 9 12 13 14 15 v x 102 , Fig . 3. The IR spectra of the condensed products : ( a ) ...
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I , arb . units 100 Ellegione L 25 35 20 , deg X - ray diffraction pattern of [ Ni ( NH3 ) 6 ] [ PtCl6 ] · 0.5H2O . ... X - ray diffraction patterns of the compound were obtained on a DRON - 3M diffractometer coupled with a TSLANP - 280 ...
I , arb . units 100 Ellegione L 25 35 20 , deg X - ray diffraction pattern of [ Ni ( NH3 ) 6 ] [ PtCl6 ] · 0.5H2O . ... X - ray diffraction patterns of the compound were obtained on a DRON - 3M diffractometer coupled with a TSLANP - 280 ...
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Vol 41 No 1 | 1 |
Synthesis and Characterization | 7 |
Deviation from Stoichiometry in Mercury Chalcochromite HgCr₂Se4 | 23 |
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